1.
Determination of detrapping times in semiconductor detectors
Scientific paper
COBISS.SI-ID:
25892391
2.
TCT measurements with slim edge strip detectors
Scientific paper
COBISS.SI-ID:
27652647
3.
Charge collection studies on custom silicon detectors irradiated up to 1.6[times]10[sup]817)n[sub](eq)/c[sup](-2)
Scientific paper
COBISS.SI-ID:
27549479
4.
Effects of accelerated long term annealing in highly irradiated n[sup]+-p strip detector examined by Edge-TCT
Scientific paper
COBISS.SI-ID:
25948455
5.
Modeling of electric field in silicon micro-strip detectors irradiated with neutrons and pions
Scientific paper
COBISS.SI-ID:
28348199