The relative sputtering yields of carbon and tantalum were determined for 1 keV Ar ion bombardment on the C/Ta and Ta/C bilayers. Sputtering yield for C is lower than for Ta for normal ion incidence angles, whereas at large angles the yields are similar. The C/Ta interface was found to be rather sharp after ion sputtering and the Ta/C interface was broad.
COBISS.SI-ID: 22906663
X-ray photoelectron spectroscopy XPS was applied to study the kinetics of copper segregation in polycrystalline Ag-2.2% Cu and Ag-5.1% Cu alloys during in-situ annealing in ultrahigh vacuum. The results show an enrichment of copper on the free surface. The results imply that the compositional changes at the surface of this alloy are dominated by copper segregation at the Ag-Cu grain boundaries.
COBISS.SI-ID: 22547751
This paper presents the results of modification of TiAlN/TiN multilayered coatings by two different pulsed lasers, a CO2 laser at 10.6 µm (100 ns pulse) and a Nd:YAG laser at 532 nm (40 ps). It was selected by the editor of the Europhysics News journal (see vol. 40, 4 (2009) p.17) as a special achievement in the last period. At this paper our research group participated in preparation of the samples as well as in characterization of the laser spots by SEM, FIB and 3D-profilometry.
COBISS.SI-ID: 22393895
Micrometer-sized defects increase friction, cause pitting corrosion and material build-up on tool surface. Based on measurements on a large series of depositions we found out the dependence of defect density on deposition parameters. A novel way for defect study is the application of 3D-profilometry and scanning electron microscopy in combination with focused ion beam (FIB).
COBISS.SI-ID: 22830887
The leader of the project team gave an invited talk at the largest and, to the best of our knowledge, oldest conference speciallized in physics of ionised gases. He presented a unique technique for tailoring the size, shape and structure of nanoparticles created on the surface of metallic films at exposure to gaseous plasma.
COBISS.SI-ID: 22781479