Many integrated sensor systems have a linear temperature coefficient that needs to be compensated. This applies also to parameters like offset temperature coefficient and sensitivity temperature coefficient. An approach for offset and sensitivity temperature coefficient compensation is developed. The output that compensates the temperature dependency is also ratiometric to the supply voltage. The design concept and simulations are presented in the paper. The system is fabricated in 0.35 µm CMOS technology. The measurement results are discussed in the paper.
B.03 Paper at an international scientific conference
COBISS.SI-ID: 7300948Reference voltage source is implemented in integrated systems that use battery as a supply voltage. It is based upon the extraction of the band gap potential of energy gap of silicon, but it uses only one half of it since 1.205 volts is too high. The reference voltage source operates down to 0.8 volts of the supply and the output voltage can be adjusted from 0.3 to 0.5 volts with an accuracy of 20 ppm/°C. In microsystems such stable reference is very often needed. The article “A compensated bandgap voltage reference with sub-1-supply voltage” was also published.
F.32 International patent
COBISS.SI-ID: 5429844Novel method, based on bandgap potential which operates at supply voltages below 1V is claimed. Architecture combines Vbe and TPAT on such a way that any voltage from 100mV and above - close to positive supply can be extracted.
F.23 Development of new system-wide, normative and programme solutions, and methods
COBISS.SI-ID: 5852244Professor Janez Trontelj is a TPC (Technical Program Committee) member of the largest and most prestigious professional conference in the world, European Solid-State Circuits Conference (ESSCIRC). The TPC members are the worlds most renowned scientists in this field. Prof. Trontelj is the only one from the new EU members. Each paper is verified by eight experts and after the consultation they choos 20% of all papers. Prof. Trontelj covers the field of sensor systems, which are related to this project.
D.03 Membership in foreign/international boards/committees
COBISS.SI-ID: 7641428In this paper we discuss a possibility to simplify and speed up testing of high-resolution ?? modulators. The methodology could be used for production testing as well as for real time built-in self-tests. We show that a pseudo-random signal is a good option for a signal source and that test method leads to efficient and cost-effective production testing that can also be used for real time built-in self-tests. The method is theoretically analyzed and verified using Matlab simulations.
B.03 Paper at an international scientific conference
COBISS.SI-ID: 6655572