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Projects / Programmes source: ARIS

Design of an absolute linear position measurement device with an optical microsystem submicron resolution

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Research activity

Code Science Field Subfield
2.09.03  Engineering sciences and technologies  Electronic components and technologies  Microelectronics 

Code Science Field
T171  Technological sciences  Microelectronics 
Keywords
linear absolute measurement, optical microsystems, integrated array of photodiodes, position measurement with nanometric resolution, photodiode array signal processing
Evaluation (rules)
source: COBISS
Evaluation of bibliographic research performance indicators according to ARIS methodology
Citations Citations for bibliographic records in COBIB.SI that are linked to records in citation databases
source: WoS source: Scopus source: COBISS
Researchers (12)
no. Code Name and surname Research area Role Period No. of publications
1.  18020  Boštjan Fink    Technical associate  2007 - 2009  0 
2.  28578  MSc Jernej Goljevšček  Electronic components and technologies  Researcher  2007 - 2009  0 
3.  01923  PhD Ivan Jan Lokovšek  Electronic components and technologies  Researcher  2007 - 2009  0 
4.  03494  PhD Marijan Maček  Electronic components and technologies  Researcher  2007 - 2009  0 
5.  24916  Franci Novak    Technical associate  2007 - 2009  0 
6.  01118  PhD Radko Osredkar  Electronic components and technologies  Researcher  2007 - 2009  3 
7.  00130  PhD Anton Pleteršek  Electronic components and technologies  Researcher  2007 - 2009  0 
8.  02377  PhD Vojan Rozman  Electronic components and technologies  Researcher  2007 - 2009  0 
9.  24326  PhD Aleksander Sešek  Electronic components and technologies  Researcher  2007 - 2009  0 
10.  00166  PhD Drago Strle  Electronic components and technologies  Researcher  2007 - 2009  65 
11.  01927  PhD Janez Trontelj  Electronic components and technologies  Head  2007 - 2009  0 
12.  10476  PhD Janez Trontelj ml.  Electronic components and technologies  Researcher  2007 - 2009  0 
Organisations (1)
no. Code Research organisation City Registration number No. of publications
1.  1538  University of Ljubljana, Faculty of Electrical Engineering  Ljubljana  1626965  65 
Abstract
The proposed applicative project is aimed at increasing the reliability in robustness of industrial measuring applications in the field of optical incremental position sensors for measuring linear displacements. Increased reliability is achieved by new, integrated optical structures that increase the quality of the sensor signals. The goal of the proposed research project is a prototype of a new measuring system with a completely new integrated optical sensor structure, intended as an integral part of the complete ASIC integrated measuring system. It is proposed that a standard 0.6 micron CMOS technology will be used. In addition, several pilot test processing runs of different optically sensitive structures on silicone are planned, with the purpose of establishing the spectral sensitivity, response, noise factor in presence of higher harmonic components of the electrical system, obtained in conversion of photons to corresponding electrical charge. The expected result of the project is a new measuring system, capable of operating in a more contaminated environment that existing systems. For this purpose a study of new active integrated optical structures is planned.</'p>
Significance for science
Accurate measurement of displacement is of prime importance in any computer controlled machine (CNC). The need to manufacture “something” requires the ability to move “something” with a very high level of accuracy. To be able to do so, accurate position sensors, also called position encoders are needed. This research and development deals with linear optical incremental position encoders that are composed of four photodiodes that produce quadrature signals and an additional photodiode that generates the index signal, which is used for absolute position encoding. The objective of this was to improve the scanning head of a linear encoder already used in the industry.As was shown, the improved scanning heads have the harmonic components suppressed by about 30 db, compared to the old scanning head. Furthermore, with the introduction of multiple scanning cells into a single scanning head, the influence of various unwanted effects was reduced, such as defects in the main and reading scale patterns or uneven illumination of the scanning head. Also, by manufacturing all the photodiodes on a single chip, the diode matching was improved. All Improvements mentioned above may further accelerate the actual measuring resolution of the integrated encoder’s SoC in CMOS technology down to deep nanometer range.
Significance for the country
As it is seen from industrial partner report the result of the research project significantly improves the measurement accuracy and resolution in the submicron region. This presents a new sensor - a product which allows better characteristic of existing products. It allows a development of new generation of products, which improves the competition ability of Iskra TELA on the market. A stable measurement system has been achieved with substantially faster calibration feature and with great improvement of aging insensitivity. This leads also to better reliability and the yield of the information carrier. At the same time the sensor current consumption has been reduced. All this is a novel approach, so there is an increased market interest, many Iskra TELA partners already expressed their intention to increase their demand for these products.
Most important scientific results Annual report 2008, final report, complete report on dLib.si
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