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Equipment source: ARIS

Scratch tester

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Purpose of equipment
The scratch tester is used for characterization of adhesion of thin films. It uses a diamond tip which is drawn along the sample surface by pressing a predefined load (or load ramp). Several parameters are recorded in-situ: scratching force, scratching coeffictient, penetration depth and acoustic emission. After the scratching procedure a post-treatment evaluation includes: residual depth, acquisition of the optical image of the whole scratch and visual determination of critical loads. The equipment configuration is particulary useful for analysis of nanolayer and nanostructured hard coatings.
Access of equipment
Responsible for equipment: PhD Peter Panjan
URL: www.nanocenter.si
first access upon agreement with responsible person, experienced operators through reservation system
Organisations (1)
no. Code Research organisation City Registration number No. of publications
1.  3050  Center of excellence on nanoscience and nanotechnology - Nanocenter, Ljubljana  Ljubljana  3666255  0 
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