Filters
cris logo
-
New search Filters
Select from list
Displayed from Show more
You have reached the maximum number of displayed search results.
All results displayed
No results are available for the search performed
Displayed from
You have reached the maximum number of displayed search results.
All results displayed
Loading results
Obtaining statistical data

Equipment source: ARIS

Atomic force microscopy (AFM) with piezo-response force microscopy, conductive-atomic force microscopy and magnetic-force microscopy moduli

Edit
Purpose of equipment
An atomic force microscope with various modules is a very useful tool for investigating the ferroelectric domain structure, ferroelectric, piezoelectric, and magnetic properties at the local (nanometer) level.
Access of equipment
Responsible for equipment: PhD Hana Uršič Nemevšek
URL: https://www.ijs.si/ijsw/Znotraj%20hi%C5%A1e/Desno?action=AttachFile&do=get&tar get=ARRS_Evidenca_opreme_2021.xlsx
by agreement: hana.ursic@ijs.si
ARIS research and infrastructure programmes (1) Legend
no. Code Title Period Head No. of publications
1.  P2-0105  Electronic ceramics, nano, 2D and 3D structures  1/1/2015 - 12/31/2021  PhD Barbara Malič  3,792 
Organisations (1)
no. Code Research organisation City Registration number No. of publications
1.  0106  Jožef Stefan Institute  Ljubljana  5051606000  91,415 
Confirmation required
Views history
Favourite